Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Chun-Hsien Liu

1PUBLICATIONS

1CO-AUTHORS

Photonic and electro-optical devices, sensors and systems (excl. communications)

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (1)

Sort by Publication Date:

|Dec 09, 2023

N-Channel MOSFET Reliability Issue Induced by Visible/Near-Infrared Photons in Image Sensors.

Chun-Hsien Liu, Sheng-Di Lin

Pageof 1

Frequent Collaborators

1 joint publications

Sheng-Di Lin

Frequent Collaborators

1 joint publications

Sheng-Di Lin

Top Related Videos

Fabrication of Flexible Image Sensor Based on Lateral NIPIN Phototransistors

Fabrication of Flexible Image Sensor Based on Lateral NIPIN Phototransistors

Published on : Jun 23, 2018

See more related videos

Top Related Videos

Fabrication of Flexible Image Sensor Based on Lateral NIPIN Phototransistors

Fabrication of Flexible Image Sensor Based on Lateral NIPIN Phototransistors

Published on : Jun 23, 2018

See more related videos