Thanh-Son Nguyen

1PUBLICATIONS
2CO-AUTHORS
Electrical circuits and systems
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Publications (1)

|Aug 26, 2023
Metal-Induced Trap States: The Roles of Interface and Border Traps in HfO2/InGaAs.

Huy-Binh Do, Quang-Ho Luc, Phuong V Pham

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Frequent Collaborators

1 joint publications

Huy-Binh Do

1 joint publications

Maria Merlyne De Souza