Yu-Ching Liao

1PUBLICATIONS
2CO-AUTHORS
Elemental semiconductors
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Publications (1)

|Sep 03, 2026
Ultrastable 50 nm Top-Gate In2O3 Transistors with ΔVTH < 0.1 mV under 104 s Bias Stress Enabled by Annealing-Free Dielectric Engineering.

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Frequent Collaborators

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Chi-Cheng Tien

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Tsai-Fu Chung