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Zhengwei Zhang, Shupeng Chen, Hongxia Liu+4
Zhengwei Zhang
Shupeng Chen
Hongxia Liu
Shulong Wang
Rui-Bo Chen
Wei Huang
<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
Published on : Jun 26, 2015