Suk Hyun Lee

1PUBLICATIONS
1CO-AUTHORS
Electrical circuits and systems
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Publications (1)

|Sep 03, 2026
Passivation-Dependent Device-Level Thermal Robustness of Indium Gallium Oxide Thin-Film Transistors under Dynamic Random-Access Memory Relevant 600 °C Nitrogen Annealing.

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Frequent Collaborators

1 joint publications

Jae Kyeong Jeong