Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Peng Chen

2PUBLICATIONS

2CO-AUTHORS

Automated software engineeringSoftware quality, processes and metrics

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (2)

Sort by Publication Date:

|Oct 29, 2025

A Novel Tool Condition Monitoring Technique of Determining Insert Flank Wear Width of Indexable Face Milling Tools Using On-Machine Laser Tool Setters.

Tao Fang, Zezhong Chen, Haibo Feng

|Jul 30, 2025

Research on Boundary Displacement of Probe Trajectory Considering Deviations in Five-Axis Sweep Scanning Measurement.

Peng Chen, Tao Fang, Zhiyong Chang

Pageof 1

Frequent Collaborators

2 joint publications

Tao Fang

1 joint publications

Zezhong Chen

Frequent Collaborators

2 joint publications

Tao Fang

1 joint publications

Zezhong Chen

Top Related Videos

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on : Feb 27, 2013

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on : Jun 13, 2023

See more related videos

Top Related Videos

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on : Feb 27, 2013

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on : Jun 13, 2023

See more related videos