Shigeru Yoshimoto

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1CO-AUTHORS
Nonlinear optics and spectroscopy
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Publications (1)

|May 08, 2026
Layer-specific porosity analysis in sub-nanoporous silica thin films using variable-energy positron annihilation lifetime technique, ellipsometric porosimetry, and attenuated total reflection infrared spectroscopy.

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Frequent Collaborators

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Kenji Ito