Jove
Visualize
Contáctanos

Videos de Conceptos Relacionados

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

También podría leer

Artículos Relacionados

Artículos vinculados a este trabajo por autores compartidos, revista y gráfico de citas.

Ordenar por
Same author

Direct coulomb and exchange interaction in artificial atoms

Physical review letters·2000
Same author

Double quantum dots as detectors of high-frequency quantum noise in mesoscopic conductors

Physical review letters·2000
Same author

The kondo effect in the unitary limit

Science (New York, N.Y.)·2000
Same author

Kondo effect in an integer-spin quantum dot

Nature·2000
Same author

Heat flow through nanobridges

Nature·2000
Same author

One photon seen by one electron

Nature·2000
JoVE
x logofacebook logolinkedin logoyoutube logo
ACERCA DE JoVE
Visión GeneralLiderazgoBlogCentro de Ayuda JoVE
AUTORES
Proceso de PublicaciónConsejo EditorialAlcance y PolíticasRevisión por ParesPreguntas FrecuentesEnviar
BIBLIOTECARIOS
TestimoniosSuscripcionesAccesoRecursosConsejo Asesor de BibliotecasPreguntas Frecuentes
INVESTIGACIÓN
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchivo
EDUCACIÓN
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualCentro de Recursos para ProfesoresSitio de Profesores
Términos y Condiciones de Uso
Política de Privacidad
Políticas

Video Experimental Relacionado

Updated: Jul 11, 2026

Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy
08:10

Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy

Published on: February 5, 2017

Nanotecnología. nanotecnología. Rebotando una pelota de C60

Kouwenhoven

    Nature
    |September 19, 2000
    PubMed
    Resumen

    No abstract available in PubMed .

    Más Videos Relacionados

    Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
    08:44

    Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene

    Published on: August 22, 2017

    Preparation and Characterization of C60/Graphene Hybrid Nanostructures
    08:40

    Preparation and Characterization of C60/Graphene Hybrid Nanostructures

    Published on: May 15, 2018

    Videos de Experimentos Relacionados

    Last Updated: Jul 11, 2026

    Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy
    08:10

    Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy

    Published on: February 5, 2017

    Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
    08:44

    Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene

    Published on: August 22, 2017

    Preparation and Characterization of C60/Graphene Hybrid Nanostructures
    08:40

    Preparation and Characterization of C60/Graphene Hybrid Nanostructures

    Published on: May 15, 2018