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Caracterización por microscopio electrónico de las matrices de nanocables de plata

Sumio Iijima1, Lu-Chang Qin

  • 1JST Nanotubulite Project, c/o NEC Corporation, 34 Miyukigaoka, Tsukuba 305-8501, Japan. iijimas@meijo-u.ac.jp

Science (New York, N.Y.)
|April 27, 2002
PubMed
Resumen

No abstract available in PubMed .

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Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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