Video Experimental Relacionado

Updated: Aug 2, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
13:58

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Published on: September 28, 2016

Retracción: Superconductividad en cristales simples del fullereno C70

J H Schön, Ch Kloc, T Siegrist

    Nature
    |March 7, 2003
    PubMed
    Resumen

    No abstract available in PubMed .

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