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La carrera hacia el micro haz de rayos X y la ciencia del nano haz de rayos X
Gene E Ice1, John D Budai, Judy W L Pang
1Oak Ridge National Laboratory, Oak Ridge, TN 37831-6132, USA. icege@ornl.gov
Science (New York, N.Y.)
|December 7, 2011
Resumen
Los micro haces de rayos X ofrecen un análisis avanzado del material, sondeando profundamente en las muestras para revelar la composición y la estructura. La investigación en curso tiene como objetivo ampliar los límites de estas poderosas herramientas de caracterización para una aplicación científica más amplia.
Área de la Ciencia:
- Ciencia de los materiales Ciencia de los materiales.
- La geofísica es la geofísica.
- La biofísica es la biofísica.
- Ciencias del medio ambiente Ciencias del medio ambiente.
Sus antecedentes:
- Los micro haces de rayos X son una tecnología de caracterización emergente con amplias aplicaciones científicas.
- Estos rayos pueden penetrar profundamente en los materiales, lo que permite el análisis de volúmenes de muestras enterradas.
Objetivo del estudio:
- Describir las capacidades de los haces de rayos X duros de submicrómetro para la caracterización de materiales.
- Para resaltar el potencial para el análisis de muestras en sus entornos nativos o extremos.
Principales métodos:
- Utilizando haces de rayos X duros de submicrometro.
- Determinar la composición local, la química y la estructura cristalina.
- Caracterizar volúmenes de muestras enterradas y muestras pequeñas.
Principales resultados:
- Los haces de rayos X duros de submicrometro pueden penetrar de decenas a cientos de micrómetros en la mayoría de los materiales.
- Se puede determinar la composición local, la química y la estructura cristalina.
- Se han demostrado haces de menos de 10 nanómetros.
Conclusiones:
- Los micro haces de rayos X proporcionan una poderosa herramienta para el análisis detallado de materiales.
- Se están realizando más investigaciones para definir los límites prácticos del tamaño y la sensibilidad del haz para la determinación de la estructura casi atómica.
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