Difracción de rayos X superficial de alta energía para la determinación rápida de la estructura de la superficie

J Gustafson1, M Shipilin, C Zhang

  • 1Synchrotron Radiation Research, Lund University, Box 118, SE-221 00 Lund, Sweden.

Science (New York, N.Y.)
|February 1, 2014
PubMed
Resumen

La difracción superficial de rayos X de alta energía permite una rápida determinación de la estructura de la superficie in situ. Este avance permite la observación en tiempo real de procesos dinámicos de superficie como la catálisis, avanzando la investigación en ciencias de los materiales.

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