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Updated: Feb 8, 2026

Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source

Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source

Published on: April 4, 2017

Corrección del editor: Integración de fotónica con nanoelectrónica de silicio para la próxima generación de sistemas

Amir H Atabaki¹, Sajjad Moazeni², Fabio Pavanello^3,4,5

¹Massachusetts Institute of Technology, Cambridge, MA, USA. atabaki@mit.edu.

|June 23, 2018

Resumen

Esta carta contiene correcciones a las afiliaciones de los autores y a la terminología. Los errores, incluidas las afiliaciones repetidas e incorrectas y una frase sobre el grosor del óxido, se han corregido en línea.

Área de la Ciencia:

Ciencias de los materiales
Nanotecnología
Física de los semiconductores

Sus antecedentes:

Una carta reciente contenía errores de producción que afectaban a las afiliaciones de los autores y a la terminología específica.
Se identificaron afiliaciones incorrectas del autor y un error de fraseo menor.

Objetivo del estudio:

Para corregir formalmente y actualizar las afiliaciones del autor.
Para corregir una frase técnica específica para mayor precisión.

Principales métodos:

Corrección de los datos de afiliación en el registro de publicación.
Modificación de la frase "dos variantes de espesor de óxido" a "dos variantes de espesor de óxido de puerta".

Principales resultados:

Las afiliaciones de los autores se han actualizado con precisión en línea.
La descripción técnica ahora especifica correctamente las "variantes de espesor del óxido de la puerta".

Conclusiones:

El registro científico es ahora exacto en cuanto a las contribuciones del autor.
Se garantiza un lenguaje técnico preciso para la claridad y la reproducibilidad.

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