Pinching-off of Coated Vesicles
Atomic Force Microscopy
Insensitive Nuclei Enhanced by Polarization Transfer (INEPT)
Imperfections in Crystal Structure: Point, Line and Plane Defects
Imperfections in Crystal Structure: Stoichiometric Point Defects
Imperfections in Crystal Structure: Non-Stoichiometric Defects
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Updated: May 13, 2026

Atomically Defined Templates for Epitaxial Growth of Complex Oxide Thin Films
Published on: December 4, 2014
Eric A Riesel1, Zhenyao Fang2, Douglas H Fabini1
1Department of Chemistry, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States.
Los estudios de alta presión revelan defectos planos únicos en los materiales de indio-bismuto (InBi), desafiando los modelos estructurales anteriores y explicando las propiedades superconductoras bajo presión.
11:34Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
Published on: May 15, 2017
10:26Soft Lithographic Procedure for Producing Plastic Microfluidic Devices with View-ports Transparent to Visible and Infrared Light
Published on: August 17, 2017
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