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X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

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X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
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X-ray Crystallography02:18

X-ray Crystallography

24.1K
The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
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Video Experimental Relacionado

Updated: Sep 9, 2025

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

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Consideraciones prácticas para el mapeo cristalográfico y de microestructuras con difracción de retroesparcimiento de

Tianbi Zhang1, Ruth M Birch1, Graeme J Francolini1

  • 1Department of Materials Engineering, University of British Columbia, 309-6350 Stores Road, Vancouver, BC V6T 1Z4, Canada.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|August 28, 2025
PubMed
Resumen
Este resumen es generado por máquina.

Los detectores de electrones directos optimizados ofrecen un análisis microstructural rápido y de alta calidad para la microscopía electrónica. Este estudio detalla las estrategias para el mapeo rápido de orientación y la recopilación avanzada de patrones de difracción de electrones (EBSD).

Palabras clave:
Detectores de electrones directos (DED)difracción por retrodispersión de electrones (EBSD)microscopía electrónica de barrido (SEM)

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Área de la Ciencia:

  • Ciencias de los materiales
  • Química analítica
  • La física

Sus antecedentes:

  • Los detectores de electrones directos compactos se utilizan cada vez más en la microscopía electrónica para el análisis microestructural rentable.
  • Estos detectores, en particular los basados en el chip Timepix, ofrecen oportunidades para mejorar la adquisición de datos.

Objetivo del estudio:

  • Optimizar un detector de electrones directo comercial para una recopilación de datos rápida y de alta calidad en microscopía electrónica.
  • Demostrar estrategias para el mapeo de orientación eficiente y la adquisición avanzada de patrones de difracción de electrones (EBSD).

Principales métodos:

  • Análisis sistemático de diversas muestras: silicio, níquel, aleación de Ti-Mo y compuesto de SiC.
  • Exploración del rendimiento del detector en condiciones variables, incluida la baja tensión y la corriente de haz corto.
  • Desarrollo de protocolos optimizados para la recopilación de patrones y mapas de orientación EBSD.

Principales resultados:

  • Se establecieron estrategias para una recopilación muy rápida de mapas de orientación.
  • Se lograron patrones EBSD de alta calidad, adecuados para aplicaciones avanzadas como el mapeo de deformaciones elásticas.
  • Se demostró la adquisición efectiva de datos a baja tensión (5-10 keV) y corriente de haz bajo.

Conclusiones:

  • Los detectores de electrones directos se pueden optimizar para un análisis microestructural eficiente y de alta calidad.
  • Las estrategias desarrolladas permiten una rápida recopilación de datos EBSD y un análisis avanzado de patrones.
  • Este trabajo facilita la caracterización microstructural accesible y detallada utilizando microscopía electrónica.