Video Experimental Relacionado
Updated: Jan 16, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Modelo de recombinación generalizado en semiconductores con defectos de varios niveles
Shanshan Wang1,2, Menglin Huang1,2, Su-Huai Wei3
1College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai 200433, China.
No abstract available in PubMed .
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