Metal-Semiconductor Junctions
Lattice Centering and Coordination Number
Metallic Solids
Semiconductors
Fermi Level Dynamics
Network Covalent Solids
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Updated: Jan 10, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Li Gao1,2, Zhangyi Chen1,3, Zhenghui Fang1,3
1Academy for Advanced Interdisciplinary Science and Technology, Key Laboratory of Advanced Materials and Devices for Post-Moore Chips Ministry of Education, State Key Laboratory for Advanced Metals and Materials, University of Science and Technology Beijing, Beijing, China.
No abstract available in PubMed .