Video Experimental Relacionado
Updated: Jan 10, 2026

08:12
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
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Contactos de unión por capas atómicas en semiconductores bidimensionales
Li Gao1,2, Zhangyi Chen1,3, Zhenghui Fang1,3
1Academy for Advanced Interdisciplinary Science and Technology, Key Laboratory of Advanced Materials and Devices for Post-Moore Chips Ministry of Education, State Key Laboratory for Advanced Metals and Materials, University of Science and Technology Beijing, Beijing, China.
Resumen
No abstract available in PubMed .
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