Video Experimental Relacionado

Updated: Jan 7, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Determinación automática del sitio atómico mediante análisis de datos de microscopía electrónica de transmisión por

Francisco Fernandez-Canizares1, Javier Rodriguez-Vazquez1, Rafael V Ferreira1

  • 1GFMC, Departamento de Física de Materiales, Universidad Complutense de Madrid, Madrid, 28040, Spain; Instituto Pluridisciplinar Universidad Complutense de Madrid, 28040, Spain.

Ultramicroscopy
|January 1, 2026
PubMed
Resumen

No abstract available in PubMed .

Palabras clave:
4D-STEM (en inglés)Difracción de electrones de haz convergenteAprendizaje profundoAprendizaje automáticoMicroscopía electrónica de transmisión por barrido

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