Video Experimental Relacionado
Updated: Jan 7, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Los defectos de sustitución y adsorción inducen la modulación local de la brecha de banda y la emisión de defectos en
Liang Zhao1, Quantai Wang1, Zhiyu Zou2
1Institute of Modern Optics, School of Physics, Key Laboratory of Micro-Nano Opto-acoustic-electronic Information System, Ministry of Industry and Information Technology, Key Laboratory of Micro-Optics and Photonic Technology of Heilongjiang Province, Harbin Institute of Technology, Harbin 150001, China.
No abstract available in PubMed .
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