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Updated: Jan 7, 2026

09:26
In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
Published on: June 26, 2015
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Microscopía electrónica de transmisión de exploración in situ / Microscopía electrónica de transmisión Estudio de la
Ching-Heng Hung1, Chong-Chi Chi2, Kai-Yuan Hsiao1
1Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 300, Taiwan.
ACS applied materials & interfaces
|January 5, 2026
Resumen
No abstract available in PubMed .

