Video Experimental Relacionado
Updated: May 5, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Estudio experimental y teórico de la evolución de los defectos en las epilojas InSb bajo irradiación gamma: un
John Fredy Ricardo Marroquin1,2, Alex Cortes Derc1, Erika Nascimento Lima3
1LabINS, Institute of Physics, University of Brasília (UnB), Federal District, Brasília 70910-900, Brazil.
No abstract available in PubMed .
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