Detection of Gross Error: The Q Test
Circuit Terminology
Imperfections in Crystal Structure: Point, Line and Plane Defects
Imperfections in Crystal Structure: Stoichiometric Point Defects
Imperfections in Crystal Structure: Non-Stoichiometric Defects
Lumber Defects
También podría leer
Artículos vinculados a este trabajo por autores compartidos, revista y gráfico de citas.
Updated: May 4, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Ahmed Jawad Rashid1, Mohammad Aman Ullah1, Adiba Isfara1
1Department of Electrical and Electronic Engineering, Islamic University of Technology, Gazipur 1704, Bangladesh.
No abstract available in PubMed .