Metallic Solids
Bonding in Metals
Colors and Magnetism
Crystal Field Theory - Octahedral Complexes
Superconductor
Electron Configuration of Multielectron Atoms
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Artículos vinculados a este trabajo por autores compartidos, revista y gráfico de citas.
Updated: Jan 13, 2026

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
Published on: June 26, 2015
Ben Zhang1, Zhen-Chao Long1, Jia-Rui Xu1
1Department of Chemistry, Engineering Research Center of Advanced Rare Earth Materials (Ministry of Education), Tsinghua University, Beijing 100084, P.R. China.
No abstract available in PubMed .
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