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$Reflection and Refraction$ 13:59

Reflection and Refraction

Source: Derek Wilson, Asantha Cooray, PhD, Department of Physics & Astronomy, School of Physical Sciences, University of California, Irvine, CA
Light travels at different speeds depending on the material through which it is propagating. When light travels from one material to another, it will either slow down or speed up. In order to conserve energy and momentum, the light must change the direction in which it propagates. This bending of light is known as refraction. Some fraction of...

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Updated: Jan 20, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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Published on: October 11, 2016

Reflectividad de rayos X de superficies a escala micrométrica utilizando nanohaces

Vedran Vonk¹, Steffen Tober², Steven J Leake³

¹Centre for X-ray and Nano Science CXNS Deutsches Elektronen-Synchrotron DESY Notkestraße 85 22607 Hamburg Germany.

Journal of applied crystallography

|January 19, 2026

Resumen

La alineación precisa es clave para las mediciones de rayos X de incidencia rasante a nanoescala. Este estudio presenta un método de escaneo de trayectoria 1D para mantener la posición de la muestra en el haz de rayos X, mejorando la precisión de los datos de reflectividad.

Palabras clave:

nanohaces de rayos X reflectividad de rayos X

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Área de la Ciencia:

Ciencia de Materiales
Ciencia de Superficies
Nanotecnología

Sus antecedentes:

La alineación precisa de la muestra es fundamental para las mediciones de rayos X de incidencia rasante a nanoescala.
Mantener una interacción haz-muestra consistente es un desafío debido a errores sistemáticos y movimiento de la muestra.

Objetivo del estudio:

Desarrollar y demostrar un método para mantener un punto de interés específico en una superficie dentro del haz de rayos X durante las mediciones de reflectividad.
Abordar los desafíos en la alineación de muestras a nanoescala para el análisis de rayos X.

Principales métodos:

Se empleó una técnica de escaneo de trayectoria 1D, variando el ángulo de incidencia (θ), el ángulo del detector (2θ) y la posición de la muestra a lo largo de un eje.
Se realizaron mediciones de reflectividad de rayos X en una isla de oro (Au) de 10 × 10 µm utilizando un haz de 90 nm.

Principales resultados:

El escaneo de trayectoria 1D mantuvo con éxito la posición de la muestra dentro del haz de rayos X.
El análisis de datos tuvo en cuenta la huella del haz de rayos X dependiente del ángulo tanto en la muestra como en el soporte circundante.

Conclusiones:

El método de escaneo de trayectoria 1D desarrollado mejora la fiabilidad de las mediciones de reflectividad de rayos X a nanoescala.
Esta técnica es valiosa para el análisis preciso de superficies cuando el posicionamiento preciso de la muestra es difícil.