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Una nueva sonda 3D para microscopía de microondas de escaneo de campo cercano

Ali M Almuhlafi¹, Omar M Ramahi²

¹Department of Electrical Engineering, College of Engineering, King Saud University, Riyadh 12372, Saudi Arabia.

Sensors (Basel, Switzerland)

|February 13, 2026

Resumen

Una novedosa sonda tridimensional (3D) de microscopía de microondas de escaneo de campo cercano (NSMM) con localización mejorada del campo eléctrico mejora la resolución de la imagen. Esta sonda 3D de resonador de anillo dividido (SRR) supera los límites de difracción para un análisis detallado de las propiedades electromagnéticas.

Área de la Ciencia:

Física Aplicada
Ciencia de Materiales
Electromagnetismo

Sus antecedentes:

La microscopía de microondas de escaneo de campo cercano (NSMM) enfrenta desafíos para lograr una alta resolución en áreas de escaneo prácticas.
Las técnicas NSMM existentes están limitadas por el límite clásico de difracción de Abbe.

Objetivo del estudio:

Presentar una novedosa sonda tridimensional (3D) de NSMM para la obtención mejorada de propiedades electromagnéticas.
Investigar cómo la geometría de la sonda influye en la resolución espacial y la fidelidad de la imagen.

Principales métodos:

Desarrollo de una sonda NSMM 3D utilizando un resonador de anillo dividido (SRR) acoplado a una línea de microcinta y cargado con barras metálicas.
Simulaciones numéricas de onda completa para extraer la función de dispersión de campo (FSF) y analizar el contenido de frecuencia espacial.
Fabricación utilizando tecnología de placa de circuito impreso (PCB) y validación experimental.

Principales resultados:

El diseño de la sonda 3D mejora la localización del campo eléctrico a través de singularidades de campo.
Las simulaciones demostraron que las FSF localizadas mejoran la fidelidad de la imagen y preservan las frecuencias espaciales más altas.
La imagen experimental de una losa dieléctrica con un vacío mostró un buen acuerdo con el modelo de convolución.

Conclusiones:

La sonda propuesta basada en SRR 3D actúa como un filtro espacial, permitiendo una mayor resolución en la obtención de imágenes NSMM.
La distribución de campo cercano diseñada es clave para superar los límites de difracción.
El diseño de la sonda ofrece una vía para mejorar la caracterización electromagnética a nanoescala.

Palabras clave:

resonadores de anillo dividido complementarios función de dispersión de campo microscopía de microondas de escaneo de campo cercano función de dispersión de punto

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