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Updated: May 6, 2026

Reduction of Iatrogenic Atrial Septal Defects with an Anterior and Inferior Transseptal Puncture Site when Operating the Cryoballoon Ablation Catheter
Published on: June 15, 2015
VSD iatrogénico, intento de cierre con complicaciones y éxito final
Jakob Schroder1, Niels Vejlstrup1, Laurence Campens1
1Department of Cardiology, Rigshospitalet, Copenhagen University Hospital, Copenhagen, Denmark.
Background:
Iatrogenic postsurgical ventricular septal defect (VSD) is a rare complication of surgical aortic valve replacement (SAVR).
Case Summary:
A patient presented with left-sided heart failure due to an initially missed postoperative VSD after redo SAVR. A moderate shunt in the perimembranous area was discovered. During the initial closure attempt, an intracardiac echocardiography catheter caused dislodgment of a ventricular pacing lead. A later closure attempt was successful with a discrete residual defect and improved patient status.
Discussion:
Postsurgical VSD is considered exceedingly rare after SAVR and presents a therapeutic challenge because of patient frailty during postsurgical recovery. Key device closure considerations include defect geometry, rim sufficiency, and avoidance of oversizing.
Take-Home Messages:
Rare postoperative VSD after SAVR is a potential cause of prolonged recovery and heart failure symptoms. The preferred treatment alternative is percutaneous device closure. Use of intracardiac echocardiographic guidance generally increases safety but may rarely cause complications.
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