Jove
Visualize
Contáctanos

Videos de Conceptos Relacionados

Energy Associated With a Charge Distribution01:21

Energy Associated With a Charge Distribution

2.0K
The work done to bring a charge through a distance r is given by the potential difference between the initial and the final position. To assemble a collection of point charges, the total work done can be expressed in terms of the product of each pair of charges divided by their separation distance, defined with respect to a suitable origin. Solving this expression gives the energy stored in a point charge distribution.
2.0K
Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

678
AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
678
Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

3.9K
Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
3.9K
Calculation of Electric Flux01:25

Calculation of Electric Flux

3.0K
Consider the electric field of an oppositely charged, parallel-plate system and an imaginary box between those plates. Let the bottom face of the box be ABCD, and the top face be FGHK. The electric field between the plates is uniform and points from the positive plate toward the negative plate. The calculation of this field's flux through the box's various faces shows that the net flux through the box is zero. Why does the flux cancel out here?
3.0K
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

1.4K
The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
1.4K
Electric Potential Energy in a Uniform Electric Field01:09

Electric Potential Energy in a Uniform Electric Field

6.6K
When an electric field accelerates a free positive charge, it acquires kinetic energy. This process is analogous to an object being accelerated by a gravitational field as if the charge were going down an electrical hill where its electric potential energy is converted into kinetic energy, although, of course, the sources of the forces are very different. The electrostatic or Coulomb force acting on the positive test charge is conservative, which means that the work done on a test charge is...
6.6K

También podría leer

Artículos Relacionados

Artículos vinculados a este trabajo por autores compartidos, revista y gráfico de citas.

Ordenar por
Same author

High-Endurance STO:YSZ Optoelectronic Memristors with Vertically Aligned Nanocomposite Structure for Edge Detection.

Advanced science (Weinheim, Baden-Wurttemberg, Germany)·2025
Same author

Hybridization capture long-read sequencing and de novo assembly of homologous haplotypes: a comprehensive hemophilia test.

Blood advances·2025
Same author

Efficient and Stable Topological/Ferroelectric Bi<sub>2</sub>Te<sub>3</sub>/SnSe Hetero-Memristor for In Situ Bionic-Visual Semi-Hardware Systems.

Advanced materials (Deerfield Beach, Fla.)·2025
Same author

Loss of SLX4IP leads to common fragile site instability and compromises DNA interstrand crosslink repair in vivo.

The Journal of biological chemistry·2025
Same author

Functional dissection of the conserved C. elegans LEM-3/ANKLE1 nuclease reveals a crucial requirement for the LEM-like and GIY-YIG domains for DNA bridge processing.

Nucleic acids research·2025
Same author

Optical genome mapping identified deletions, inversions, and insertions in hemophilia.

Blood advances·2024
Same journal

Vogel spiral-based tilt-scan averaging approach for robust and efficient diffraction contrast suppression in DPC STEM.

Microscopy (Oxford, England)·2026
Same journal

Development of a specialized diamond knife for controlled notch introduction in ultrathin polymer films for in situ tensile transmission electron microscopy.

Microscopy (Oxford, England)·2026
Same journal

Study of nanocrystals within lamellar structures of polyvinylidene fluoride using phase plate scanning transmission electron microscopy.

Microscopy (Oxford, England)·2026
Same journal

Capability of angle-resolved SXES experiment examined by hexagonal BN and its application for the chemical bonding state of Fe2B.

Microscopy (Oxford, England)·2026
Same journal

Cryo-EELS elemental mapping of organic-solvent systems.

Microscopy (Oxford, England)·2026
Same journal

In-situ biasing DPC STEM observation of GaAs p-n junction.

Microscopy (Oxford, England)·2026
Ver todos los artículos relacionados
JoVE
x logofacebook logolinkedin logoyoutube logo
ACERCA DE JoVE
Visión GeneralLiderazgoBlogCentro de Ayuda JoVE
AUTORES
Proceso de PublicaciónConsejo EditorialAlcance y PolíticasRevisión por ParesPreguntas FrecuentesEnviar
BIBLIOTECARIOS
TestimoniosSuscripcionesAccesoRecursosConsejo Asesor de BibliotecasPreguntas Frecuentes
INVESTIGACIÓN
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchivo
EDUCACIÓN
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualCentro de Recursos para ProfesoresSitio de Profesores
Términos y Condiciones de Uso
Política de Privacidad
Políticas

Video Experimental Relacionado

Updated: Feb 20, 2026

Preparing a Celadonite Electron Source and Estimating Its Brightness
09:14

Preparing a Celadonite Electron Source and Estimating Its Brightness

Published on: November 5, 2019

4.9K

Cálculo de distribuciones de energía iniciales para fuentes de emisión de campo

John Rouse1, Catherine Rouse1, Haoning Liu1

  • 1Munro's Electron Beam Software Ltd, 14 Cornwall Garden, London, SW7 4AN, UK.

Microscopy (Oxford, England)
|February 19, 2026
PubMed
Resumen
Este resumen es generado por máquina.

Los investigadores derivaron fórmulas analíticas para las distribuciones de energía de electrones en fuentes de emisión de campo. Esto permite simulaciones eficientes de Monte Carlo para una mejor comprensión de los fenómenos de emisión de electrones.

Más Videos Relacionados

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
06:58

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Published on: July 12, 2016

10.0K
X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
10:16

X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells

Published on: August 20, 2019

14.5K

Videos de Experimentos Relacionados

Last Updated: Feb 20, 2026

Preparing a Celadonite Electron Source and Estimating Its Brightness
09:14

Preparing a Celadonite Electron Source and Estimating Its Brightness

Published on: November 5, 2019

4.9K
Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
06:58

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Published on: July 12, 2016

10.0K
X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
10:16

X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells

Published on: August 20, 2019

14.5K