Dependencia de la temperatura de los mecanismos de transporte electrónico en fotodetectores basados en rGO

Reduced graphene oxide (rGO) has attracted interest as a potential, cost-effective alternative to graphene layers produced by single-crystal thin-film growth techniques. Its solubility in various solvents, the ability to tune its optical and electrical properties, the ability to manipulate the optoelectronic properties of rGO-based heterojunctions, and the possibility of depositing it on flexible substrates broaden its potential applications, from electro-optical communications to environmental monitoring. In this work, we present a characterization of reduced graphene oxide (rGO) deposited on p-type Si₃N₄/Si substrate using different techniques such as Raman spectroscopy, optical transmittance, and current-voltage measurements under dark and illuminated conditions in the 400-700 nm range. Furthermore, the temperature dependence of the photocurrent of the rGO-based photoconductive device was studied in the temperature range from 300 K to 77 K. It has been shown that the electron transport mechanism through the p-type rGO/SiN/Si heterojunction at low voltage involves mainly a hopping process at 77 K and a thermionic mechanism at room temperature. Furthermore, the Fowler-Nordheim tunneling and trap-limiting mechanisms allow the presence of charge carriers in the device at both temperatures. Estimation of the main figures of merit, responsivity, detectivity, and NEP, shows an improvement in photodetection performance at low temperatures.