Determinación del tamaño de nanopartículas mediante microscopía polarizada de barrido a través del enfoque

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Updated: Aug 7, 2026

Utilization of Plasmonic and Photonic Crystal Nanostructures for Enhanced Micro- and Nanoparticle Manipulation

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Published on: September 27, 2011

Wenhui Zhou, Chunjie Zhai, Zhaolou Cao

|February 27, 2026

Abstract:

Accurate qualitative and quantitative characterization of sub-micron nanoparticles with a high efficiency is highly desirable across a wide range of scientific and industrial applications. In this study, we introduce through-focus scanning polarized microscopy (TSPM) for the estimation of nanoparticle parameters, where physical properties of nanoparticles are related to in-focus and out-of-focus polarization-resolved images. The feasibility of TSPM is rigorously demonstrated through a combination of numerical simulation and experimental measurements. Owing to its practical advantages, TSPM is anticipated to emerge as a powerful and versatile tool for highly sensitive metrology of nanoscale objects in material sciences and semiconductor industries.

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