関連する実験動画

Updated: Jul 12, 2026

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
09:26

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

Published on: June 26, 2015

低伝導性の固体に対する光放射実験における擬似ギャップと外部損失

Joynt1

  • 1Department of Physics, University of Wisconsin-Madison, 1150 University Avenue, Madison, WI 53706, USA.

Science (New York, N.Y.)
|April 30, 1999
PubMed
まとめ

オーム分散による光電子のエネルギー損失は,導電性固体における観測されたスペクトルを変化させる可能性があります. マンガネートや導体などの材料で顕著なこの効果は,偽ギャップ現象を模倣することができます.

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