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Updated: Jun 24, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

電子ドーピングされた高温超伝導体におけるd(x2-y2) のような超伝導ギャップの観測

T Sato1, T Kamiyama, T Takahashi

  • 1Department of Physics, Tohoku University, Sendai 980-8578, Japan., Institute for Chemical Research, Kyoto University, Uji 611-0011, Japan.

Science (New York, N.Y.)
|February 27, 2001
PubMed
まとめ

高解像度スペクトルスコピーは,電子ドーピングされたコプラートにおけるアニゾトロプ的超伝導のギャップを明らかにします. この発見は,高温超伝導体における電子穴対称性の存在を示唆している.

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Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe1+YTe Using a Spin-polarized Scanning Tunneling Microscope09:06

Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe1+YTe Using a Spin-polarized Scanning Tunneling Microscope

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