Metal-Semiconductor Junctions
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Updated: Jun 28, 2026
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
H He1, J Zhu, N J Tao+3
1Department of Physics, Florida International University, Miami, Florida 33199, USA.
No abstract available in PubMed .
A Closed-Type Wireless Nanopore Electrode for Analyzing Single Nanoparticles
Published on: March 20, 2019
Application of a Coupling Agent to Improve the Dielectric Properties of Polymer-Based Nanocomposites
Published on: September 19, 2020