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Updated: May 1, 2026

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
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Published on: June 26, 2015

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電子衝突によるH+3イオンの破壊のためのメカニズム

V Kokoouline1, C H Greene, B D Esry

  • 1Department of Physics and JILA, University of Colorado, Boulder, Colorado 80309-0440, USA.

Nature
|August 31, 2001
PubMed
まとめ

Jahn-Teller効果は,最も単純な三原子イオン (H+3) と低エネルギー電子の解離性再結合を著しく加速し,実験速度に匹敵する. この突破は,星間雲におけるH+3の観測を説明する.

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