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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Mass Analyzers: Common Types01:19

Mass Analyzers: Common Types

The quadrupole mass analyzer consists of four cylindrical metal rods arranged in a diamond carrying a DC voltage and a radio-frequency AC voltage. The motion of ions through the quadrupole depends on the field strength, causing only ions of a certain m/z to resonate successfully and strike the detector at a given field strength. Though the transmission rate for these analyzers is high, the exact elemental composition of the sample is not determined because of low resolution; however, they are...
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.
Electronic Distance Measuring Instruments01:30

Electronic Distance Measuring Instruments

Electronic Distance Measuring Instruments (EDMs) are essential tools in modern surveying, offering precise distance measurements by emitting electromagnetic signals and calculating the time required for these signals to travel to a target and return. Two primary types of signals are used in EDMs — light waves and microwaves — each suited to specific environmental and distance requirements. Light-wave-based EDMs utilize either infrared or laser light, providing high accuracy over short distances...

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関連する実験動画

Updated: May 28, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

アット・セカンド・メトロロジー

M Hentschel1, R Kienberger, C Spielmann

  • 1Institut für Photonik, Technische Universität Wien, Gusshausstr. 27, A-1040 Wien, Austria.

Nature
|December 6, 2001
PubMed
まとめ
この要約は機械生成です。

研究者らは,サブフェムト秒の柔らかいX線パルスを使って電子ダイナミクスのアット秒 (10^-18s) の解像度を達成しました. この画期的な発見により,以前はフェムト秒 (10−15秒) のレーザーパルスでは利用できなかった超高速の電子プロセスの研究が可能になった.

さらに関連する動画

Measurement of Ultrafast Vibrational Coherences in Polyatomic Radical Cations with Strong-Field Adiabatic Ionization
08:22

Measurement of Ultrafast Vibrational Coherences in Polyatomic Radical Cations with Strong-Field Adiabatic Ionization

Published on: August 6, 2018

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

関連する実験動画

Last Updated: May 28, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Measurement of Ultrafast Vibrational Coherences in Polyatomic Radical Cations with Strong-Field Adiabatic Ionization
08:22

Measurement of Ultrafast Vibrational Coherences in Polyatomic Radical Cations with Strong-Field Adiabatic Ionization

Published on: August 6, 2018

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

科学分野:

  • 物理 物理学 物理学とは
  • 量子力学は,量子力学という
  • スペクトロスコーピーは,スペクトロスコーピーを用います.

背景:

  • ウルトラショートレーザーパルスは,物質動力学の研究に不可欠です.
  • フェムト秒パルスは分子動態を捉えるが,アト秒の電子プロセスは捉えない.

研究 の 目的:

  • 150 アット秒 (アット秒) (アット秒) (アット秒) (アット秒) (アット秒) (アット秒) (アット秒) (アット秒) (アット秒) (アット秒) (アット秒) (アット秒) (アット秒)) またはそれ以下の時間解像度を達成するために.
  • サブフェムト秒の柔らかいX線パルスと可視光を用いて電子ダイナミクスを追跡する.

主な方法:

  • サブフェムト秒の柔らかいX線パルスを利用しました.
  • 探査のために,数サイクルの可視光パルスを使用した.
  • X線と可視パルス間のアット秒同期を達成しました.

主要な成果:

  • 原子システムのアット秒応答を実証した.
  • 柔らかいX線パルス持続を650 +/- 150as.で測定しました.
  • 電子ダイナミクスの第2解像度を達成しました.

結論:

  • アットセカンドスペクトロスコピーの実験ツールを開発した.
  • アット秒のスケールで結合電子のダイナミクスを研究するための道が開かれました.