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Updated: Jul 8, 2026

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
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In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

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超薄で二重接続された超伝導気筒における全相相合性の破壊

Y Liu1, Y Zadorozhny, M M Rosario

  • 1Department of Physics, The Pennsylvania State University, University Park, PA 16802, USA. liu@phys.psu.edu

Science (New York, N.Y.)
|December 18, 2001
PubMed
まとめ

空洞の超伝導体における超流体の速度は,サンプルサイズが小さくなると増加し,超伝導性の破壊につながります. この研究は,超薄いシリンダの断絶した相相合領域を,より大きなシリンダとは異なり,明らかにしています.

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