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Updated: Aug 7, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

マテリアル・リサーチ・ソサエティの会合. 超小型と超敏感の組み立て

R F Service

    Science (New York, N.Y.)
    |December 26, 2001
    PubMed
    まとめ

    No abstract available in PubMed .

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    Super-resolution Fluorescence Microscopy01:37

    Super-resolution Fluorescence Microscopy

    Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.