関連する実験動画

Updated: Jul 13, 2026

Evaluating Plasmonic Transport in Current-carrying Silver Nanowires
09:00

Evaluating Plasmonic Transport in Current-carrying Silver Nanowires

Published on: December 11, 2013

銀ナノワイヤ配列の電子顕微鏡による特徴付け

Sumio Iijima1, Lu-Chang Qin

  • 1JST Nanotubulite Project, c/o NEC Corporation, 34 Miyukigaoka, Tsukuba 305-8501, Japan. iijimas@meijo-u.ac.jp

Science (New York, N.Y.)
|April 27, 2002
PubMed
まとめ

No abstract available in PubMed .

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Fabrication and Operation of a Nano-Optical Conveyor Belt

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Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope10:25

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope

Published on: September 14, 2018

関連する概念動画

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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