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Updated: Jul 19, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
13:58

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Published on: September 28, 2016

電子ドーピングされたC60単層の帯状構造とフェルミ表面

W L Yang1, V Brouet, X J Zhou

  • 1Advanced Light Source (ALS), Materials Science Division, Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA 94720, USA.

Science (New York, N.Y.)
|April 12, 2003
PubMed
まとめ

アルカリドーピングされたC60フルレリドは,強い電子相互作用により,有意な帯域分散を示します. これらの相互作用にもかかわらず,ルチンゲル定理のような基本的理論は,これらの複雑な材料に対して有効である.

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