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Updated: Jun 25, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

孤立した分子半導体分子の構成と発光

Melissa A Summers1, Paul R Kemper, John E Bushnell

  • 1Department of Chemistry and Biochemistry, University of California, Santa Barbara, Santa Barbara, California 93106-9510, USA.

Journal of the American Chemical Society
|April 24, 2003
PubMed
まとめ

オリゴ・フェニル・ビニレン (OPV) 分子の構造と発光を直接比較すると,分子形状と光放出効率の強い相関が明らかになる. この発見は,有機半導体特性についての理解を深める.

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