DNA

Dmitri Y Petrovykh1, Hiromi Kimura-Suda, Lloyd J Whitman

  • 1Physics Department, University of Maryland, College Park, Maryland 20742, USA. dmitri.petrovykh@nrl.navy.mil

まとめ

X線光電子スペクトロスコーピー (XPS) とフーリエ変換赤外線 (FTIR) スペクトロスコーピーは,金に対するDNA不動化を定量的に特徴づけています. 電子衰弱を考慮した正確なXPS分析は,FTIRと整合し,正確な表面カバー計算を可能にします.

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