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関連する実験動画

Updated: Jul 14, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

半導体産業:チップリング

Geoff Brumfiel

    Nature
    |October 8, 2004
    PubMed
    まとめ

    No abstract available in PubMed .

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    Last Updated: Jul 14, 2026

    Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
    08:12

    Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

    Published on: December 5, 2015

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    Hybrid-Cut: An Improved Sectioning Method for Recalcitrant Plant Tissue Samples

    Published on: November 23, 2016

    Fabrication of Micro-Patterned Chip with Controlled Thickness for High-Throughput Cryogenic Electron Microscopy
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