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Updated: Jul 26, 2026

Thermal Measurement Techniques in Analytical Microfluidic Devices
08:29

Thermal Measurement Techniques in Analytical Microfluidic Devices

Published on: June 3, 2015

ナノテクノロジーの尺度を得ること

Andrew Watson

    Science (New York, N.Y.)
    |November 20, 2004
    PubMed
    まとめ

    No abstract available in PubMed .

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    Atomic Force Microscopy01:08

    Atomic Force Microscopy

    Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
    The AFM Probe
    The probe is regarded as the heart of any AFM setup and comprises the...