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Updated: Jun 10, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Si(001) 表面上の異質な分子ワイヤの理論的予測

Jin-Ho Choi1, Jun-Hyung Cho

  • 1Quantum Photonic Science Research Center, Department of Physics, Hanyang University, 17Haengdang-Dong, Seongdong-Ku, Seoul 133-791, Korea.

Journal of the American Chemical Society
|March 23, 2006
PubMed
まとめ

研究者は,シリコン表面に新しい異質な分子ワイヤを作成するための自己組み立て方法を開発しました. この技術はピリジンとボリンの分子を利用し,高度な材料製造のための選択的化学反応性を実証しています.

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