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Updated: Jun 14, 2026

Selective Area Modification of Silicon Surface Wettability by Pulsed UV Laser Irradiation in Liquid Environment
08:48

Selective Area Modification of Silicon Surface Wettability by Pulsed UV Laser Irradiation in Liquid Environment

Published on: November 9, 2015

Si/Au上のCF3CO2-terminated有機単層に対するX線損傷:電子の主要な影響

P E Laibinis, R L Graham, H A Biebuyck

    Science (New York, N.Y.)
    |November 15, 1991
    PubMed
    まとめ

    X線は,有機物質に損傷を与える電子を生成します. この研究では,直接のX線ではなく,これらの二次電子が,自己組み立てモノレイヤーの損傷の主な原因であることが判明しました.

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