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Updated: Jul 12, 2026

Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
11:48

Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography

Published on: April 24, 2018

X線結晶学の直接的な方法

H Hauptman

    Science (New York, N.Y.)
    |July 11, 1986
    PubMed
    まとめ

    X線屈折データから結晶構造を決定することは,相が失われるため,困難です. しかし,以前の原子に関する知識を取り入れることで,diffraction magnitudesのみを用いた正確な結晶構造の決定が可能になります.

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