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関連する概念動画

Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Mass Analyzers: Overview01:13

Mass Analyzers: Overview

The mass analyzer is a crucial component of the mass spectrometer. In the ionization chamber, the vaporized sample is bombarded with a high-energy electron beam to generate a radical cation and further fragment into neutral molecules, radicals, and cations. A series of negatively charged accelerator plates accelerate the cations into the mass analyzer. The mass analyzer separates ions according to their mass-to-charge (m/z) ratios and then directs them to the detector. The common types of mass...
Atomic Spectroscopy: Absorption, Emission, and Fluorescence01:23

Atomic Spectroscopy: Absorption, Emission, and Fluorescence

Atomic spectroscopy is a vital tool in elemental analysis, both qualitatively and quantitatively. It can be broadly divided into optical spectroscopy, mass spectroscopy, and X-ray spectroscopy methods. The optical spectroscopic methods are atomic absorption spectroscopy (AAS), atomic emission spectroscopy (AES), and atomic fluorescence spectroscopy (AFS). The first step in all three methods is atomization, where the solid, liquid, or solution-phase samples are converted into gas-phase atoms and...
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.

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関連する実験動画

Updated: Jul 9, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
06:53

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

Published on: July 27, 2018

原子力顕微鏡による真の原子解像度 排斥力と吸引力を通して原子力顕微鏡による真の原子解像度

F Ohnesorge, G Binnig

    Science (New York, N.Y.)
    |June 4, 1993
    PubMed
    まとめ

    原子力顕微鏡では,水中のカルシート分裂平面の原子細部が明らかになった. この研究では,真の原子解像度を達成し,欠陥を特定し,強化された表面分析のために原子間力を測定しました.

    科学分野:

    • マテリアルサイエンス 材料科学
    • 表面科学とは,地表科学である.
    • ナノテクノロジー ナノテクノロジー

    背景:

    • 原子レベルで結晶表面を理解することは,物質の特性や振る舞いを予測するために重要です.
    • カルシート (炭酸カルシウム) は,地質学および産業における重要な用途を持つ一般的な鉱物です.
    • 石灰岩の割裂平面に関する以前の調査は,水性環境における真の原子規模の解像度が欠けていました.

    研究 の 目的:

    • 水中の環境で原子力顕微鏡 (AFM) を使用してカルシートの (1014) 割れ目平面を調査する.
    • カルシート表面の真の横断原子尺度解像度を達成し,実証する.
    • ステップラインや欠陥を含む原子規模の特徴を特徴づけ,原子間力を測定する.

    主な方法:

    • 原子力顕微鏡 (AFM) を使用して,カルシット (1014) 割れ目平面をイメージしました.
    • 実験は室温の脱イオン化水で行われ,自然条件を模倣した.
    • 表面の地形と相互作用を分析するために,高解像度画像と力測定を行いました.

    主要な成果:

    • カルシート (1014) 表面で,真横の原子尺度解像度が成功裏に達成されました.
    • 原子スケールの周期と,単位細胞内の原子の相対的な位置が正確に決定されました.

    さらに関連する動画

    Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
    07:24

    Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

    Published on: May 10, 2021

    Picometer-Precision Atomic Position Tracking through Electron Microscopy
    15:04

    Picometer-Precision Atomic Position Tracking through Electron Microscopy

    Published on: July 3, 2021

    関連する実験動画

    Last Updated: Jul 9, 2026

    Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
    06:53

    Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

    Published on: July 27, 2018

    Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
    07:24

    Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

    Published on: May 10, 2021

    Picometer-Precision Atomic Position Tracking through Electron Microscopy
    15:04

    Picometer-Precision Atomic Position Tracking through Electron Microscopy

    Published on: July 3, 2021

  • 単原子のステップラインに沿った点状の欠陥として識別された原子規模のキックは解決されました.
  • サンプル原子の位置とAFMの先端の間の10^-11Nの引力力が直接測定されました.

    • 結論:

    • 水中のAFMは,カルシートのような順番の良い表面に対して,比類のない原子スケールの解像度を提供します.
    • この研究は,原子規模の欠陥を成功裏に特定し,原子間力を測定し,その技術を検証した.
    • この高解像度画像と力測定機能は,表面分析と欠陥特徴付けのための信頼できる方法を提供します.