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Updated: Jul 12, 2026

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
08:31

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)

Published on: February 10, 2021

スキャニング電気化学顕微鏡で表面の化学イメージング

A J Bard, F R Fan, D T Pierce

    Science (New York, N.Y.)
    |October 4, 1991
    PubMed
    まとめ

    スキャニング電気化学顕微鏡 (SEM) は,電流の変化を測定することによって表面の画像を撮影します. この技術は,サンプルトポグラフィーと反応性を明らかにし,電極や生物サンプルなどの多様な材料を研究するのに理想的です.

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