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関連する概念動画

Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...

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関連する実験動画

Updated: Jul 12, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

スキャントンネル顕微鏡におけるピコ秒解像度

G Nunes, M R Freeman

    Science (New York, N.Y.)
    |November 12, 1993
    PubMed
    まとめ

    研究者らは,スキャニングトンネル顕微鏡を用いて,迅速な時間解像度を持つ実験を行う新しい方法を開発した. この技術は,ピコ秒の時間解像度を達成し,動的現象の原子規模の調査を可能にします.

    科学分野:

    • 物理 物理学 物理学とは
    • マテリアルサイエンス 材料科学
    • 表面科学とは,地表科学である.

    背景:

    • スキャントンネル顕微鏡 (STM) は,原子スケールの空間解像度を提供します.
    • ナノスケールでの超高速ダイナミック現象を調査するには,高い時間解像度が必要です.

    研究 の 目的:

    • STMを用いた迅速な時間解析の実験のための方法を開発する.
    • ナノスケールダイナミック研究のための超高速光学技術とSTMの空間解像度を組み合わせる.

    主な方法:

    • スキャニングトンネル顕微鏡の電流-電圧の特性における固有の非線形性を利用した.
    • 超高速光学方法を使用して,一時的な信号を生成しました.
    • 実験的な測定のためのピコ秒時間スケールの解像度を達成しました.

    主要な成果:

    • ピコ秒の時間スケールで光学的に生成された一時信号を解決しました.
    • 原子規模の空間解像度と超高速時間解像度を組み合わせる能力を実証した.

    結論:

    • 開発された方法は,原子スケールでのダイナミック現象を調査するための強力なツールを提供します.

    さらに関連する動画

    Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy
    10:28

    Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy

    Published on: May 27, 2018

    Scanning-probe Single-electron Capacitance Spectroscopy
    10:53

    Scanning-probe Single-electron Capacitance Spectroscopy

    Published on: July 30, 2013

    関連する実験動画

    Last Updated: Jul 12, 2026

    All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
    11:33

    All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

    Published on: January 19, 2018

    Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy
    10:28

    Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy

    Published on: May 27, 2018

    Scanning-probe Single-electron Capacitance Spectroscopy
    10:53

    Scanning-probe Single-electron Capacitance Spectroscopy

    Published on: July 30, 2013

  • この技術は,素材や表面における一時的な過程を前例のない詳細で研究するための新しい道を開きます.