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Updated: Jul 12, 2026

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
10:28

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on: July 5, 2016

フーリエ変換による高解像度イメージング X線ホログラフィー

I McNulty, J Kirz, C Jacobsen

    Science (New York, N.Y.)
    |May 15, 1992
    PubMed
    まとめ

    フーリエ変換X線ホログラフィーは,ゴールド試験対象の60ナノメートルの解像度を達成しました. この柔らかいX線技術では,フレネールゾーンプレートとデジタル記録を用いて詳細な画像を撮影します.

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