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Updated: Jul 12, 2026

Measurements of Soil Carbon by Neutron-Gamma Analysis in Static and Scanning Modes
07:51

Measurements of Soil Carbon by Neutron-Gamma Analysis in Static and Scanning Modes

Published on: August 24, 2017

地下地質化学のためのニュートロンとガンマ線散射の測定

D V Ellis

    Science (New York, N.Y.)
    |October 5, 1990
    PubMed
    まとめ

    井戸ログの計測器は,物理的なサンプルなしで地下炭化水素層を評価するために,電気,音響,核測定を使用します. 最近の進歩により,破壊的でない地化学分析が可能になり,地質学者や地球物理学者に恩恵をもたらしています.

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    Scanning Electron Microscopy01:07

    Scanning Electron Microscopy

    A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
    Fundamental Principles
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